Defect Detection

Using SolVision’s AI Inspection Solution, minute defects such as fine scratches can be located and marked on sample images to train the AI model.

Inspecting Safety Certification Marks. Solomon SolVision’s AI automated detection of defective certification marks.

Automated defect detection with artificial intelligence. Visual Inspection of Semiconductor Carrier Trays.

SolVision detects defective electrodes on passive electronic components to significantly improve overall production yield.

Inspect small spiral-surfaced metals with SolVision AI for precise defect detection, identifying cut marks, collision faults, and subtle surface flaws.

As semiconductor manufacturing becomes more sophisticated, the process of creating lead frames needs to improve in accuracy and yield.

Excessive adhesive may remain on the chip or overflow on the circuit board and cause the chip to tilt, affecting stability of the whole semiconductor package.

Faulty wafers also usually have subtle defects randomly scattered on the surface, and this prevents AOI systems from setting rules for efficient inspections.

Powered by AI, SolVision deep learning software trains an AI model by simulating potential weld bead defects in random brightness conditions.