Semiconductors

Using SolVision’s AI Inspection Solution, minute defects such as fine scratches can be located and marked on sample images to train the AI model.

Explore how META-aivi optimizes waste management with AI, reducing errors and avoiding contamination while enhancing the efficiency of plastic parts recycling.

SolVision employs AI to enhance IC tray inspection, ensuring precise detection and elevating quality assurance standards in the semiconductor industry.

The Anomaly Detection tool uses deep learning technology to teach the AI model sample images of “perfect” wafers.

The location, size and shape of cracks vary each time, and traditional optical inspection cannot accurately identify such unpredictable defects.

Using SolVision’s Instance Segmentation tool, irregular lines and multi-drilling defects are labeled in sample images to train the AI model.

Using SolVision’s AI Inspection Solution, minute defects such as fine scratches can be located and marked on sample images to train the AI model.

SolVision enables visual inspection through AI image analysis, strengthening the reliability of displacement and angle information to recognize defective products and errors in the die bonding process.

Automated defect detection with artificial intelligence. Visual Inspection of Semiconductor Carrier Trays.