Inspect small spiral-surfaced metals with SolVision AI for precise defect detection, identifying cut marks, collision faults, and subtle surface flaws.

Faulty wafers also usually have subtle defects randomly scattered on the surface, and this prevents AOI systems from setting rules for efficient inspections.

There are many types of defects that may appear differently each time on the stamped parts, in particular oil or water stains, which are not easily detected.

Deploy SolVision’s advanced AI model to identify and classify cells where traditional AOI systems are insufficient in detecting and determining cell variations.