Case Studies

SolVision utilizes AI for precise inspection and defect detection in plastic buckle clips, enhancing quality control and production efficiency.

Using SolVision’s AI Inspection Solution, minute defects such as fine scratches can be located and marked on sample images to train the AI model.

Inspecting Safety Certification Marks. Solomon SolVision’s AI automated detection of defective certification marks.

Solomon SolVision’s Feature Detection tool first learns the position of the tray, then performs OCR with more flexibility than AOI systems.

Automated defect detection with artificial intelligence. Visual Inspection of Semiconductor Carrier Trays.

SolVision detects defective electrodes on passive electronic components to significantly improve overall production yield.

Overcoming traditional AOI limitations, Solomon’s SolVision quickly performs OCR without being affected by background or lighting conditions, complexity, or appearance of the serial number.

As semiconductor manufacturing becomes more sophisticated, the process of creating lead frames needs to improve in accuracy and yield.

Excessive adhesive may remain on the chip or overflow on the circuit board and cause the chip to tilt, affecting stability of the whole semiconductor package.