Solomon’s SolVision AI quickly identifies socks defects with real-time defect detection, improving quality control and efficiency for textile manufacturers.
Overcoming traditional AOI limitations, Solomon’s SolVision quickly performs OCR without being affected by background or lighting conditions, complexity, or appearance of the serial number.
Faulty wafers also usually have subtle defects randomly scattered on the surface, and this prevents AOI systems from setting rules for efficient inspections.
There are many types of defects that may appear differently each time on the stamped parts, in particular oil or water stains, which are not easily detected.
Deploy SolVision’s advanced AI model to identify and classify cells where traditional AOI systems are insufficient in detecting and determining cell variations.