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SolVisionCase Study

Visual Inspection of Semiconductor Carrier Trays

Automated defect detection with artificial intelligence

Stability and positioning of semiconductor trays

Semiconductor carrier trays are indispensable to semiconductor processing, and they come in different formats and material according to the application and environment. In addition to the safety and stability of chips, the position and picking points of trays need to match feed mechanisms precisely during production. The quality of the tray therefore reflects the success of production automation. 

Automated defect detection with artificial intelligence

Inspecting complex backgrounds and obscure defects

The outline and positioning holes of carrier trays are prone to defects such as chipping and warping caused by production temperature and long-term usage. These trays were previously screened using traditional methods – yet due to their complex formats and the obscure, random nature of tray defects, implementing rule-based vision systems for visual inspection tasks often led to production yield and efficiency issues.

Overcoming the obstacles of traditional inspections

SolVision’s Segmentation tool is capable of recognizing defects by locating and labeling them, even in complex backgrounds, to monitor for production anomalies and be able to eliminate faulty trays in real time.

AI Inspection

Complete inspection

Original

IC Tray inspection

Result

IC Tray inspection

Positioning hole gaps and frame defects

Original

IC Tray inspection

Result

IC Tray inspection

Complete inspection

Original

IC Tray inspection

Result

IC Tray inspection

Border defects

Original

IC Tray inspection

Result

IC Tray inspection
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